Abstract

A mixed sequential power cycling experiment was conducted to assess the impact of load sequence on IGBT module lifetime. Two AC power cycling conditions with different junction temperature swings were alternated in sequences designed to provide equivalent lifetime consumption based on single-stress test data. Each sequence was kept much shorter than the expected device lifetime to ensure proper mixing of stress conditions. The results show that the mixed sequence leads to a significantly shorter lifetime than predicted by linear cumulative-damage summation (Miner’s rule), highlighting a clear sequence-interaction effect in device fatigue.

Diego Velazco_1 , François Wallart_1 , Yohan Cousin_1, Emmanuel Batista_2, Michel Piton_2  
 
1 – SuperGrid Institute, France 

2 – Alstom SA, France 

Presented at PCIM 2026
Winner of the Best Paper Award