An experimental study of a high-current vacuum arc (VA) generated between two static CuCr25 contacts spaced 20 or 30 mm apart was conducted to characterize the arc appearance and the cathode spot (CS) distribution.
“POWER GRIDS CONTROL: DRIVERS AND TRENDS” by Bruno Luscan, SuperGrid Institute’s keynote presentation at EPE'18 ECCE EUROPE is now available online!
“POWER GRIDS CONTROL: DRIVERS AND TRENDS” by Bruno Luscan, SuperGrid Institute’s keynote presentation at EPE'18 ECCE EUROPE is now available online!
The objective of this study is to propose a methodology for the transient stability assessment of a simple but representative AC grid in case of DC fault. After validation of the methodology, some HVDC link protection criteria are defined in terms of the Critical Time to Return to Operation. These criteria will be helpful for the design of HVDC protection systems or for the sizing of future HVDC links in order to respect the constraints of the existing protection strategies.
An exciting week at SuperGrid Institute with the Fête de la Science 2018! After the open house visits on Saturday the 6th of October, we welcomed students from three high school classes over the following week.
An exciting week at SuperGrid Institute with the Fête de la Science 2018! After the open house visits on Saturday the 6th of October, we welcomed students from three high school classes over the following week.
In accordance with their interesting properties, ionic liquids (ILs) have attracted in the recent years a great interest in the material field. Recently, few authors have demonstrated the reactivity of ionic liquids towards epoxy in order to form new epoxy-based networks...
Once a year, CIGRE young members France, organizes industrial, onsite visits where academics, engineers and experts can share and discuss with scholars. This year, SuperGrid Institute has accepted to host this meeting on our premises on the 18th of October 2018.
Once a year, CIGRE young members France, organizes industrial, onsite visits where academics, engineers and experts can share and discuss with scholars. This year, SuperGrid Institute has accepted to host this meeting on our premises on the 18th of October 2018.
Gate-oxide technology weakness is a main reliability issue of Silicon Carbide MOSFET transistors. The threshold voltage shift is a critical phenomenon that addresses the reliability of industrial power applications. It is important to have a better understanding of the phenomena implied in the gate threshold voltage shift. In this context, HTGB test is proposed and the resulting gate oxide stress is studied and discussed in this paper.
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